4

Thermal stability of EL2 in GaAs

Year:
1989
Language:
english
File:
PDF, 228 KB
english, 1989
5

Silicon surface nano-oxidation using scanning probe microscopy

Year:
2006
Language:
english
File:
PDF, 825 KB
english, 2006
6

Electrical behaviour of aluminium-porous silicon junctions

Year:
1995
Language:
english
File:
PDF, 370 KB
english, 1995
7

10.1038/18860

Year:
1999
Language:
english
File:
PDF, 567 KB
english, 1999
8

Identification of a defect in a semiconductor: EL2 in GaAs

Year:
1986
Language:
english
File:
PDF, 1.39 MB
english, 1986
14

Irradiation-induced defects in p -type GaAs

Year:
1986
Language:
english
File:
PDF, 1.04 MB
english, 1986
18

As superlattices

Year:
1989
Language:
english
File:
PDF, 604 KB
english, 1989
19

Defect-enhanced annealing by carrier recombination in GaAs

Year:
1986
Language:
english
File:
PDF, 468 KB
english, 1986
20

Comment on ‘‘Atomic model for the EL 2 defect in GaAs’’

Year:
1989
Language:
english
File:
PDF, 53 KB
english, 1989
22

Electron-irradiation-induced defects in Si-Ge alloys

Year:
1992
Language:
english
File:
PDF, 237 KB
english, 1992
23

EPR observation of a platinum pair complex in Si

Year:
1988
Language:
english
File:
PDF, 181 KB
english, 1988
24

Defect-assisted apparent lowering of band offsets

Year:
1994
Language:
english
File:
PDF, 309 KB
english, 1994
25

Profiling of defects using deep level transient spectroscopy

Year:
1986
Language:
english
File:
PDF, 708 KB
english, 1986
32

Defects in Heterostructures and Superlattices

Year:
1989
File:
PDF, 439 KB
1989
36

Electrical characterization of a superlattice

Year:
1987
Language:
english
File:
PDF, 274 KB
english, 1987
38

Electrical behaviour of a sheet of defects

Year:
1992
Language:
english
File:
PDF, 345 KB
english, 1992
40

Defects introduced by high temperature electron irradiation in n-GaAs

Year:
1983
Language:
english
File:
PDF, 213 KB
english, 1983
42

Transient capacitance spectroscopy in heavily compensated materials

Year:
1985
Language:
english
File:
PDF, 187 KB
english, 1985
45

Molecular interactions of PTCDA on Si(1 0 0)

Year:
2005
Language:
english
File:
PDF, 537 KB
english, 2005
50

Microscopic characterization of defects using scanning tunneling microscopy

Year:
2000
Language:
english
File:
PDF, 187 KB
english, 2000